| Injection-Locking Technology |
Required Laser Power

The required laser power is determined by the sensitivity
of the photoresist to be used, the transmittance of the lithography
tool optics, and the stage speed of the lithography tool. For KrF
lithography, the maximum photoresist sensitivity, transmittance
of the optics, and maximum stage speed are 50 mJ/cm2, approx. 15%,
and 500 mm/s, respectively. Therefore, the laser power required
for KrF lithography is 40 W. Laser power of this level can be attained
by increasing the repetition rate of the laser.
For ArF lithography, on the other hand, the photoresist sensitivity
is higher than that for KrF lithography, while the stage speed
is almost the same. The biggest difference is the transmittance
of the optics, which for ArF lithography is 1/2 to 1/3 of that
for KrF lithography. This is one of the reasons that an ArF laser
requires approx. twice the power of a KrF laser. Also, the ArF
laser has a problem in that the emission efficiency is low. If
the same electrical power is applied to both ArF and KrF lasers,
the emission efficiency of the ArF laser is approx. 1/2 that of
the KrF laser since the transmittance of the laser optics is also
bad. As the result, the technological hurdle for an ArF laser is
approx. 4 times that of a KrF laser. In order to meet such challenges,
simply increasing the repetition rate is not sufficient; a breakthrough
technology is required.
The GigaTwin Platform

In order to meet such a high power requirement,
we at Gigaphoton have developed the GigaTwin platform that uses
an injection locking method as a breakthrough technology. The laser
unit using this method incorporates two laser chambers (twin-chamber
configuration), each of which is mounted with an optical resonator.
In this configuration, one chamber emits a low-output, narrow-bandwidth
laser while the other chamber amplifies the laser output from the
first chamber to the maximum level.
Development of the injection locking technology at Gigaphoton
dates back to the 1990s. In 1993 through 1994, we joined a big
project sponsored by the Ministry of International Trade and Industry,
and developed an ArF laser with a repetition rate of 200 Hz and
an output of 300 W. In 2000 through 2002, we further developed
a F2 laser with a repetition rate of 5 kHz and an output of 30
W in the ASET F2 lithography project.

Figure 1. Injection-Locking System and MOPA System
Injection Locking and MOPA Methods

Figure 1 shows a typical twin-chamber laser system. Both of the
injection locking and MOPA methods use two chambers. The big difference
is that the injection locking method uses an amplifier chamber
mounted with an optical resonator, thus enabling the amplifier
chamber itself to also function as a resonator.
In the injection locking method, the line-narrowing chamber (oscillator)
first starts to discharge to form a narrow-spectral-bandwidth laser
by resonating the laser beam between the line-narrowing module (LNM)
and the mirror. The laser beam is then introduced into the amplifier
chamber via the laser transfer system, and the amplifier chamber
starts discharge synchronizing with the output from the line-narrowing
chamber. In the amplifier chamber, the laser beam is amplified multiple
times by the optical resonator, for as long as discharge continues,
and then it is output from the output mirror as the final beam. Mounting
of the optical resonator on the amplifier chamber allows highly effective
amplification to produce sufficiently large power even if the output
from the line-narrowing chamber is small. In addition, the beam stay
time in the line-narrowing chamber is short, allowing the start of
discharge in the amplifier chamber to be timed easily.
The operation of the MOPA method is the same as the injection locking
method for the line-narrowing chamber (Master Oscillator), while
it limits the number of beam amplifications to twice in the amplifier
chamber (Power Amplifier). Therefore, the MOPA method requires an
output from the line-narrowing chamber that is several times higher
than that of the injection locking method. Also, the beam stay time
in the line-narrowing chamber is short, which is likely to cause
the final output power to vary depending on the discharge start time.
In such a comparison as above, the injection locking method seems
to be superior to the MOPA method. However, it has been indicated
that there are two critical challenges in application of the injection
locking method to lithography. They are related to ASE and coherence.
We’ll discuss these in the next issue…
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